Gerald E. Jr. Jellison: search on Z-Library

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1

Time-resolved ellipsometry

Jellison Jr., Gerald E., Lowndes, Douglas H.

Journal:

Year:

1985

Language:

english

File:

PDF, 1.02 MB

english, 1985

2

Advanced method for increasing the efficiency of white light quantum dot LEDs

Chad E. Duty, Charlee J. C. Bennett, Adrian S. Sabau, Gerald E. Jellison Jr., Phillip R. Boudreaux, Steven C. Walker, Ron Ott

Journal:

physica status solidi (a)

Year:

2011

Language:

english

File:

PDF, 192 KB

english, 2011

3

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - Characterization of linear diattenuator and retarders using a two-modulator generalized ellipsometer (2-MGE)

Jellison, Jr., Gerald E., Griffiths, C. Owen, Holcomb, David E., Rouleau, Christopher M., Goldstein, Dennis H., Chenault, David B.

Year:

2002

Language:

english

File:

PDF, 1.06 MB

english, 2002

4

ChemInform Abstract: Structure and Properties of Single Crystalline CaMg2Bi2, EuMg2Bi2, and YbMg2Bi2.

Andrew F. May, Michael A. McGuire, David J. Singh, Radu Custelcean, Gerald E. Jr. Jellison

Journal:

Year:

2012

Language:

english

File:

PDF, 22 KB

english, 2012

5

Determination of optical birefringence by using off-axis transmission ellipsometry

Jellison, Jr., Gerald E., Rouleau, Christopher M.

Journal:

Year:

2005

Language:

english

File:

PDF, 120 KB

english, 2005

6

SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII - CdTe and Cd0.9Zn0.1Te crystal growth and characterization for nuclear spectrometers

Mandal, Krishna C., Kang, Sung H., Choi, Michael, Wright, Gomez, Jellison, Jr., Gerald E., Franks, Larry A., Burger, Arnold, James, Ralph B., Barber, H. Bradford, Doty, F. Patrick, Roehrig, Hans

Year:

2006

Language:

english

File:

PDF, 686 KB

english, 2006

7

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Optical Diagnostic Methods for Inorganic Transmissive Materials - Measurements of the optical functions of uniaxial crystals using two-modulator generalized ellipsometry (2-MGE)

Jellison, Jr., Gerald E., Modine, Frank A., Boatner, Lynn A., Datla, Raju V., Hanssen, Leonard M.

Year:

1998

Language:

english

File:

PDF, 293 KB

english, 1998

8

Bioluminescent-bioreporter integrated circuits form novel whole-cell biosensors

Michael L. Simpson, Gary S. Sayler, Bruce M. Applegate, Steven Ripp, David E. Nivens, Michael J. Paulus, Gerald E. Jellison Jr

Journal:

Trends in Biotechnology

Year:

1998

Language:

english

File:

PDF, 891 KB

english, 1998

9

SPIE Proceedings [SPIE 5th Annual International Symposium on Smart Structures and Materials - San Diego, CA (Sunday 1 March 1998)] Smart Structures and Materials 1998: Smart Electronics and MEMS - Bioluminescent bioreporter integrated circuits (BBICs)

Simpson, Michael L., Sayler, Gary S., Nivens, David, Ripp, Steve A., Paulus, Michael J., Jellison, Jr., Gerald E., Varadan, Vijay K., McWhorter, Paul J., Singer, Richard A., Vellekoop, Michael J.

Year:

1998

Language:

english

File:

PDF, 1.67 MB

english, 1998

10

SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII - Amorphous selenium based detectors for medical imaging applications

Mandal, Krishna C., Kang, Sung H., Choi, Michael, Jellison, Jr., Gerald E., Franks, Larry A., Burger, Arnold, James, Ralph B., Barber, H. Bradford, Doty, F. Patrick, Roehrig, Hans

Year:

2006

Language:

english

File:

PDF, 1.02 MB

english, 2006

11

Normal-incidence generalized ellipsometry using the two-modulator generalized ellipsometry microscope

Jellison Jr., Gerald E., Hunn, John D., Rouleau, Christopher M.

Journal:

Year:

2006

Language:

english

File:

PDF, 612 KB

english, 2006

12

Two-channel polarization modulation ellipsometer

Jellison, Jr., Gerald E., Modine, F. A.

Journal:

Year:

1990

Language:

english

File:

PDF, 2.11 MB

english, 1990

13

SPIE Proceedings [SPIE High-Power Lasers and Applications - San Jose, CA (Saturday 25 January 2003)] Photon Processing in Microelectronics and Photonics II - Synthesis of multifunctional single-wall carbon nanotube-amorphous diamond thin film composites

Geohegan, David B., Schittenhelm, C. H., Puretzky, Alexander A., Lance, M. J., Jellison, Jr., Gerald E., Britt, Philip F., Pique, Alberto, Sugioka, Koji, Herman, Peter R., Fieret, Jim, Bachmann, Fried

Year:

2003

Language:

english

File:

PDF, 1.41 MB

english, 2003

14

Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry

Arteaga, Oriol, Canillas, Adolf, Jellison, Jr., Gerald E.

Journal:

Year:

2009

Language:

english

File:

PDF, 1.32 MB

english, 2009

15

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Laser Applications in Microelectronic and Optoelectronic Manufacturing IV - Pulsed-laser-deposited amorphous diamond and related materials: synthesis, characterization, and field emission properties

Merkulov, Vladimir I., Lowndes, Douglas H., Baylor, Larry R., Jellison, Jr., Gerald E., Puretzky, Alexander A., Geohegan, David B., Dubowski, Jan J., Helvajian, Henry, Kreutz, Ernst-Wolfgang, Sugioka,

Year:

1999

Language:

english

File:

PDF, 1.38 MB

english, 1999

16

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Polarization: Measurement, Analysis, and Remote Sensing II - Calibration procedures for a two-modular generalized ellipsometer

Jellison, Jr., Gerald E., Modine, Frank A., Chen, Chi, Goldstein, Dennis H., Chenault, David B.

Year:

1999

Language:

english

File:

PDF, 338 KB

english, 1999

17

Transmission Two-Modulator Generalized Ellipsometry Measurements

Jellison, Jr., Gerald E., Griffiths, C. Owen, Holcomb, David E., Rouleau, Christopher M.

Journal:

Year:

2002

Language:

english

File:

PDF, 432 KB

english, 2002

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